ADI's Precision Wide Bandwidth Low Latency Measurement and Drive

Delivering low noise at high sampling rates (up to 33 MUPS drive and 15MSPS measurement), this low latency signal chain delivers the noise and latency combination to meet faster control loop response time needs. In test systems like Source Measurement Units (SMU) or Hardware in the Loop (HiL), faster accurate measurement is driving the need for faster response times for precision digital control loops.

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