University of Warwick Secures Funding for SiC and GaN Reliability Testing

University of Warwick Secures Funding for SiC and GaN Reliability Testing

The University of Warwick has secured major funding to boost the UK’s ability to test the reliability of advanced semiconductors used in electric vehicles, renewable energy, and other critical technologies.

The funding will support the purchase of the Wide-Bandgap (WBG) Dynamic Reliability & Robustness Tester, a state-of-the-art testing system from UK-based world-leading manufacturer, ipTEST Ltd. The new system will enable researchers to subject next-generation power semiconductor devices to extreme test conditions to assess their performance and failure modes.

These devices, made from materials such as silicon carbide (SiC) and gallium nitride (GaN), are central to modern electrification, improving efficiency, enabling faster charging, and supporting power systems across transport, energy, and aerospace. Ensuring their reliability is vital, particularly in safety-critical applications.

Professor Peter Gammon, REWIRE IKC Lead at the University of Warwick, said: “This award is transformative for the University of Warwick and the REWIRE IKC. By enabling fast, repeatable, and industry-aligned reliability testing, this equipment will allow us to build the UK’s first comprehensive SiC and GaN reliability database. It also provides a foundation for new commercial services that will support UK manufacturers, SMEs, and international device suppliers alike.”

Access to advanced reliability testing remains limited in the UK, particularly for smaller companies. The new facility at Warwick will help address this gap by providing high-quality, independent testing that businesses can trust.

By simulating real-world stresses—such as high voltages and fault conditions—the system will help researchers and industry partners better understand device performance, reduce failure risk, and accelerate innovation.

The system forms part of the £12 million REWIRE Innovation and Knowledge Centre (IKC), the UK’s national centre for wide-bandgap semiconductor reliability and represents a major addition to national capability.

The investment is expected to:

  • Strengthen UK research leadership through one of the most comprehensive reliability datasets
  • Support industry growth by enabling faster, more confident product validation
  • Establish a national testing service for UK manufacturers and innovators

The new equipment will be housed within Warwick’s Driving the Electric Revolution – Innovation Centre (DER-IC). It is expected to be fully operational by April 2026 and will be available to academic and industry users across the UK through established booking pathways.

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