The MGD3162AM550EK from NXP Semiconductor is an Automotive-Qualified Advanced Single-Channel Gate Driver designed to drive the latest SiC and IGBT modules for xEV traction inverters. It requires a supply voltage of 5 V. This gate driver consists of integrated galvanic isolation, power management units, gate drive control circuit, logic block, 10-bit ADC, temperature sensor, protection circuits, and programmable interfaces. It has an integrated boost capability that can drive most of the SiC MOSFET and IGBT/SiC modules directly and can shape the capability of gate drive operation to improve the switching performance and reduce voltage stress. This driver IC uses either the SPI interface or the GS Enable pins to control the gate strength and further improves the performance via independent operation.

This AEC-Q100 Grade 1-qualified gate driver is equipped with an 8-bit CRC algorithm for error checking of SPI and configuration data and autonomously provides faults and status indications via the interrupt pins. It also integrates built-in self-test (BIST) and control protection functions, enabling the design of high functional safety integrity level systems according to ASIL C/D standards. This driver is available in a 32-pin wide-body, surface-mount package.